Frequency Selection of Sine Wave for Dynamic ADC Test

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Maximum Likelihood Estimation of ADC Parameters from Sine Wave Test Data

The sine wave test is maybe the most important method for characterizing ADC’s. By this, the acquisition device is excited with a sinusoidal signal, and a long series of output values is measured. With the help of these observations, the parameters of the DUT can be determined. The general method to do this is the Least Squares (LS). In this paper, we present a similar method using the Maximum ...

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ژورنال

عنوان ژورنال: Measurement Science Review

سال: 2010

ISSN: 1335-8871

DOI: 10.2478/v10048-010-0035-1